X-ray Laue and Bragg diffraction on oxygen precipitates in annealed CZ-Si wafers

نویسندگان
چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

EVALUATION OFDISLOCATION STRUCTURE AND CRYSTALLITE SIZE IN WORN AL-SI ALLOY BY X-RAY DIFFRACTION

Abstract: powerful method for the characterization of microstructures of crystalline materials in terms of crystallite size anddislocation structures. In this paper the effect of the sliding on the microstructure of A356 in the as-cast and heattreated conditions are studied, The X-ray phase analysis shows that with increasing applied load, the dislocationdensity is increased, whereas the crysta...

متن کامل

Simulations of time-resolved x-ray diffraction in Laue geometry

A method for computer simulation of time-resolved x-ray diffraction (TRXD) in asymmetric Laue (transmission) geometry with an arbitrary propagating strain perpendicular to the crystal surface is presented. We present two case studies for possible strain generation by short-pulse laser irradiation: (i) a thermoelastic-like analytical model; (ii) a numerical model including the effects of electro...

متن کامل

Nano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy

ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...

متن کامل

8 X - ray diffraction : the contributions of Max von Laue , W . H . and W . L . Bragg and

The experimental technique which has been of the greatest importance in revealing the structure of crystals is undoubtedly X-ray diffraction. The story of the discovery of X-ray diffraction in crystals by Laue,∗ Friedrich and Knipping in Munich in 1912 and the development of the technique by W. H. Bragg∗ andW. L. Bragg∗ in Leeds and Cambridge in the years preceding the First World War is well k...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Acta Crystallographica Section A Foundations of Crystallography

سال: 2012

ISSN: 0108-7673

DOI: 10.1107/s0108767312094937